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Laboratories

Introduction

Laboratories

Introduction

Surface Analysis Lab image

The lab has a Secondary Ion Mass Spectrometer and Atomic Force Microscopy, which enables the lab to provide nano-scale surface analysis for semiconductor, metals, and inorganic substances. The surface analysis includes the determination of molecular chemical composition , detection of element present in ppm level and depth profiling by powerful sputtering process. The lab performs XRD, a X-ray analysis, to characterize the element and crystalline phase composition of samples.

Key activities
  • Particle shape, size and height on the surface of materials
  • Quantitative assessment of surface roughness
  • To determine elemental and molecular chemical composition of the surface
  • - Analysis of crystal structure using X-ray systeme