High Resolution Transmission Electron Microscope 2
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| Short Name | HRTEM 2 (STEM/EDS) |
| Model Name | JEM-2100F |
| Laboratory | 미세구조분석실//[82101]투과전자현미경실Ⅰ |
| maker | JEOL |
| Installed Year/Price | 200303 / 1,402,913,633 |
| Staff Name | 김현정(Kim Hyunjung) 031-299-6735 |
| Main Appplication Field | |
| The equipment measure the phase and crystal structure for tiny region using transmission electron, diffraction electron, and X-ray after electron beam with a short wavelength pass through a sample with nano-thickness.짧은 파장의 전자선을 시편에 투과 시킨 후 투과전자, 회절전자, X-선 등을 이용하여 미소 영역의 상관찰, 결정구조 해석 및 조성을 분석하는 기기 | |
| Basic Specification | |
| STEM unit, HAADF unit, FLC unit, UltraScan CCD Camera unit, EDS unit(point,line,map 분석가능) | |