Field Emission Scanning Electron Microscope 4 (EDS)
Short Name | FESEM 4 (EDS) |
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Model Name | JSM-7600F |
Laboratory | 미세구조분석실//[81B101]주사전자현미경실Ⅱ,Ⅳ |
maker | JEOL |
Installed Year/Price | 201104 / 468,404,015 |
Staff Name | 김순섭 031-299-6776 |
Main Appplication Field | |
Analysis of phase, chemical elements, crystal structure at small region for materials needing the high resolution 고해상도를 요구하는 재료의 상관찰, 화학조성분석, 결정구조분석 | |
Basic Specification | |
- EI resolution : 1.5 nm (1 kV) in GB mode, 1.0 nm (15 kV) - Magnification 25 to 1,000,000x - Accelerating voltage 0.1 to 30 kV - EDS 장착 |