고분해능투과전자현미경1 (HRTEM1)
| 사진 |
 |
|---|---|
| 영문명/단축명 | High Resolution Transmission Electron Microscope / HRTEM 1 (EDS) |
| 모델명 |
JEM-3010 / Oxford x-max 80T(EDS) |
| 설치장소 | 미세구조분석실 / [82105]TEM lab.1 |
| 제작사 | JEOL |
| 도입년도/가격 | 1999.10월 / 745,358,368원 |
| 담당자/연락처/e-mail | 김지혜(Kim Jihye) / 031-299-6738 / kjh1102@skku.edu |
♦ Features
• Seamless Integration
- FasTEMoffers high throughput operating environment that integrates the TEM, different analytical detectors and most advanced image processing.
• Real-time Remote Control
- A newly developed system architecture allows remote control with comfort from all over the world via network
♦ Additional Options
• Energy Dispersive X-Ray Spectrometer (EDS)
- Resolution : 129 eV@Mn
- Detector : Silicon drift detector (SDD)
- Detection Range : Be to Cf
- 기본 성분 분석 가능 (원소, wt%, at%)
- Point, Line, Mapping 분석불가
• STEM, EELS 기능없음
♦ Specification
• Resolution: TEM: 0.17nm(Point), 0.14nm(Lattice)
• Magnification: 4,000x - 1,500,000x
• Accelerating Voltage: 300kV
• Camera length range: 120 - 3,000mm
• Specimen Tilt range +/-20 degrees (X & Y)
♦ Application Data
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