고해상도투과전자현미경2 (HRTEM2)
| 사진 |
 |
|---|---|
| 영문명/단축명 | High Resolution Transmission Electron Microscope / HRTEM 2 (STEM/EDS) |
| 모델명 |
JEM-2100F / Oxford x-max 80(EDS) |
| 설치장소 | 미세구조분석실 / [82101]TEM lab.2 |
| 제작사 | JEOL |
| 도입년도/가격 | 2003.3월 / 1,402,913,633원 |
| 담당자/연락처/e-mail | 김현정(Kim Hyunjung) / 031-299-6735 / banhada0@skku.edu |
♦ Features
• Field Emission Electron Gun
- The JEM-2100F is equipped with a field emission electron gun (FEG) that produces high brightness (100 times greater than LaB6 tip) and is highly stable. This feature is essential for nano-scale ultrahigh resolution and analysis
• STEM and EDS
- The JEM-2100F incorporates multiple additional functions such as a high sensitivity scanning transmission electron microscope (STEM) image observation device and an energy dispersive X-ray spectrometer (EDS) system allowing simple and integrated data acquisition
- All operations of the main instrument, including data display and instrument control, are integrated with a PC, thus greatly improving operability
♦ Additional Options
• Energy Dispersive X-Ray Spectrometer (EDS)
- Resolution : 129 eV@Mn
- Detector : Silicon drift detector (SDD)
- Detection Range : Be to Cf
• STEM(BFI, HAADF)
• EELS 기능없음
♦ Specification
• Resolution
- TEM: 2.3 Å(Point image), 1.0 Å(Lattice image)
- STEM: 2.0 Å(BF Lattice image), 2.0 Å(DF Lattice image)
• Magnification
- MAG mode x4K~1500K (27)
• Electron gun: ZrO/W (100 )_FEG-Thermal
• Specimen tilt angle : ±35 º/ ±30 º
♦ Application Data
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