고해상도투과전자현미경4 (HRTEM4)
| 사진 |
 |
|---|---|
| 영문명/단축명 | High Performance EDS embbed Transmission Electron Microscope / HRTEM 4 |
| 모델명 |
JEM-F200 |
| 설치장소 | 미세구조분석실 / [82101]투과전자현미경실Ⅰ |
| 제작사 | JEOL |
| 도입년도/가격 | 2023.12월 / 원 |
| 담당자/연락처/e-mail | 박재현(PARK Jaehyun) / 031-299-6715 / jhpark03@skku.edu |
♦ Features
• Quad-Lens condenser system
- Easy selection of illumination conditions
• Pico stage drive
- Fast and precise stage combining new actuator and piezo drive
• Improved cold FEG
- High brightness with small energy spread
• Dual SDD EDS
- High efficient analysis
• Advance scan system
- High stabilized multifunction STEM
♦ Additional Options
• Energy Dispersive X-Ray Spectrometer (EDS)
- Resolution : 133 or less
- Detector : Silicon drift detector (SDD)
- Detection Range : Be to U
• Direct camera
♦ Specification
• Resolution
- TEM: 0.23nm (point), 0.1nm (lattice)
- STEM: 0.16nm (DF)
• Magnification
- TEM: ×50 – x2,000,000
- STEM: ×200 – x150,000,000
• Electron gun
- Cold field emission gun
- Accelerating voltage: 20 – 200 kV
♦ Application Data
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