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분석실 안내

연구장비 소개

분석실 안내

연구장비 소개

유도결합플라즈마 질량분석기2(ICP-MS2)

이온크로마토그래피 장비
사진
영문명/단축명 Inductively coupled plasma mass spectrometer / ICP-MS2
모델명 NexIon 2000
설치장소 무기분석실 / [81615A]무기분석실Ⅱ
제작사 Perkin Elmer
도입년도/가격 2021. 10월 / 176,212,506
담당자/연락처/e-mail 박미란(Park Miran)/ 031-299-6751 / mrpark@skku.edu

 

♦ Features

 

 A dedicated SMARTintro sample-introduction module simplifies operator setup, streamlining your workflows

 Extended Dynamic Range capabilities provide the ability to detect high-and low-level elements in a single sample run

 Three quadrupoles, three gas channels, and three modes of operation combine to offer better interference removal, delivering better detection limits/improved data accuracy

 The industry’s fastest data acquisition speed on the market (100,000 points/sec) to handle any particle size

 A new solid-state RF generator with revolutionary LumiCoil technology

- first ICP-MS RF coil that requires no maintenance or cooling

 Triple Cone Interface with Quadrupole Ion Deflector, delivering no maintenance beyond the cones

• Patented LumiCoil® technology enhances coil durability and allows semi-permanent use

• Stable plasma implementation with 34mHz frequency method

• Optimal sensitivity and reproducibility

• Highly efficient interference removal possible by using up to 4 reaction gases

• Equipped with QID that can be used semi-permanently without cleaning

• STD, KED, and DRC modes can be used simultaneously through patented UCT (Universal Cell Technology)

 

♦ Specification

 

 Plasma viewing: vertical type dual view

 RF Frequency : 34MHz

 RF Power Range : 0.5KW ~ 1.6KW to 1W

 Type : free running

 Mass Spectrometer Type : Quadrupole with Universal Cell which has band pass control

 Mass Range : ~ 285m/z

 Eliminate Interference System : Universal Cell Technique and Octopole Reaction system

 Reaction cell based Quadrupole

 

 

♦ Application Data

 

 Environmental Testing

 In-Service Lubricants Analyses

 Geochemical Analysis

 Food Safety and Nutrients Testing

 Pharmaceutical Testing

 Semiconductor Testing