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분석실 안내

연구장비 소개

분석실 안내

연구장비 소개

형광엑스선분석기(XRF)

이온크로마토그래피 장비
사진
영문명/단축명 X Ray Fluorescence System / XRF(KOLAS장비)
모델명 S8 Tiger
설치장소 무기분석실//[81603]공동기기원실험실
제작사 BRUKER
도입년도/가격 2016. 12월 / 279,361,215
담당자/연락처/e-mail 김종환(Kim Jonghwan) / 031-299-6741 / kjh8668@skku.edu

 

♦ Features

 

  Wavelength dispersive X-ray fluorescence (WDXRF) 

- Separates the characteristic wavelengths with a very high degree of resolution

- Optimized analyzer crystals and detectors are used to separate and count the emitted X-rays

- Unsurpassed in terms of analytical accuracy and precision.

•  Fast and accurate analysis in wide range of elements from Na to U

fully automated sequential type Wavelength Dispersive X-ray Fluorescence

•  Directly analyze each element without destroying the sample.

•  Qualitative & Qiamtotatove analysis

•  Suitable for Scanning various elements of unknown sample

 

♦ Specification

 

 • X-Ray Spectrometer

 • X-RayGenerator: 4KW

 • End-Window X-Ray Tube

 • Primary Beam Filter: 10 Position(Al,Cu,Black,Option)

 • Bidirectional Collimator: 0.23˚, 0.46˚, 0.17˚

 • CollimatorMask: Manual 34mm, 28mm, 8mm

 • Vacuum Pump

 • DetectorSystem: F-PC, SC

 • Bidirectional Crystal Changer: LiF200, PET, XS-55

   - Cyrstal LiF220 / .Crystal XS-400

 • Sample Stage  : Sample Magazine 60 Positions

   - Sample Holder: 34mm*5ea, 28mm*1ea, 8mm*1ea

 • SPECTRA Plus Analytical S/W (Element measurement)

   - Data Acquisition, Qualitative&Quantitative Analysis, Standardless Measurement

   - Integrated Analytical Intelligence(IA)&Automatic Setup&Calibration Sys.(ACS)

 • QUANT-EXPRESS : Standardless Analysis Package

 • Quantitative Analysis Solutions

   - PETRO-QUANT Basic  /  .GEO-QUANT M & T  /  .ML Plus, Multilay S/W

   - CEMENT-/RoSH-/METAL-/POLYMER-QUANT

 • Sample Preparation Sys.

   - Katanax X-300 Automatic Electric Fusing Device W/3Positions

   - Crucible(Approx.26g Pt/Au) for Katanax Fusing Devices

   - Casting Mold(Approx.34g Pt/Au) for Kantanax Fusing(for 40mm Beads)

 • ML PLUS Analytical S/W (Thin Film Thickness measurement)

   - Data Acquisition, Qualitative&Quantitative Analysis, Standardless Measurement

   - Integrated Analytical Intelligence(IA)&Automatic Setup&Calibration Sys.(ACS)

 

 

 

♦ Application Data