고출력 박막용 엑스선회절분석기(HP-Thin Film XRD)
| 사진 |
 |
|---|---|
| 영문명/단축명 | High Power Thin Film X-Ray Diffractometer System / HP-Thin Film XRD |
| 모델명 | D8 ADVANCE |
| 설치장소 | 표면분석실 / [81B105]엑스선분석실 |
| 제작사 | Bruker Corporation |
| 도입년도/가격 | 2011년 2월/ 250,000,000원 |
| 담당자/연락처/e-mail | 김미래(Kim Mirae) / 031-299-6736 / mrmr24@skku.edu |
♦ Features
• Rotating Anode : 6kW
♦ Analyze Mode
• th/2th scan
• 2th scan (GID, GI-XRD)
• phase 분석(search-match)
♦ Additional Options
• ICDD Database PDF-2
• Software : EVA
♦ Specification
• X-ray generator
- Max 18kW (Rotating anode)
- X-ray target : Cu (1.54Å)
• Goniometer
- Scanning mode : Theta-theta vertical type
- Goniometer radius : 250mm
- Min. Step : 0.0001°
• Detector
- Scintilation Counter
♦ Application Data
• Phase분석(search-match): ICDD database matching(원소정보필요)
